Material Testing Lab China
We excel in thermal testing expertise in China
Linseis Shanghai Scientific, a subsidiary of Linseis Messgeräte GmbH, is a hub of innovation and precision in material analyses and application measurements, upholding Linseis‘s global standards.
Our in-house lab, equipped with cutting-edge instruments, is staffed by a skilled team committed to precision and adherence to Linseis‘s rigorous quality standards.
- samples are tested under real-world conditions
- send in your own samples for analysis and we will prepare it for your measurement
- the laboratory serves as a training center where customers and partners are educated in the operation of complex measuring instruments
- customer-oriented service through its testing laboratory
Are you interested in a measurement in our laboratory?
Would you like to talk to one of our chemists / physicists about the measurement conditions?
Contact us today!
Sebastian
Tel.: +49 (0) 9287/880 0
labor[at]linseis.de
Overview of the
Available contract measurements:
Below you will find an overview of possible measurement methods in our laboratories.
DIL – Dilatometry
- Determination of coefficient of thermal expansion and thermal expansion
- between -150°C and 1750°C
- Measurement from $350,-
- According to ASTM D 696, ASTM E 228, ASTM E 831, ASTM E 1363, ASTM E 1545, ASTM E 1824, DIN 53752
DSC – Differential scanning calorimetry
- Measurement of enthalpy, phase transitions and specific heat capacity (Cp),
- Measurement from -150°C to 1550°C
- Measurement from $350,-
- According to ASTM C 351, ASTM D 3417, ASTM D 3895, ASTM D 4565, ASTM E 793, ASTM E 794, DIN 51004, DIN 51007, DIN 53765, DIN 65467, DIN EN 728, ISO 10837, ISO 11357, ISO 11409
STA – simultaneous thermal analysis
- Simultaneous measurement of TG and DSC for determination of mass change and calorimetric effects between RT and 1550°C
- Measurement from $500,-
- According to ASTM E 914, ASTM E 1131, ASTM E 1868, DIN 51006, ISO 7111, ISO 11358
LFA – Laser Flash Analysis
- Measurement of thermal diffusivity, thermal conductivity and specific heat capacity between RT and 1500°C
- Measurement from $550,-
- According to ASTM E 1461, DIN 30905, DIN EN 821
TIM-Tester – Thermal Interface Materials/ Thermal Conductivity
- Measurement of thermal conductivity and thermal impedance between RT and 150 °C
- Measurement from $300,-
- According to ASTM D 5470
LSR – Seebeck-, resistance- and ZT measurement
- Measurement of seebeck-coefficient, electric conductivity / electric resistance and figure of merit (ZT) between RT and 1100°C
- Measurement from $400,-
- According to JIS R 1650-1
HCS – Hall effect, charge carrier and Seebeck measurement
- Measurement of electrical conductivity / resistivity, carrier density, carrier mobility, Hall constant, Seebeck coefficient
Between -150 °C and 600 °C - Measurement from $350,-
- According to ASTM F76-08
How to order a contract measurement:
- Request an individual measurement quotation using our form
- Send samples to the coefficient of thermal expansion testing lab of Linseis Thermal Analysis
- We perform the measurements
- After about 2-3 weeks you will receive the measurement results and a final report
And here are the details:
- Please request a custom quote through our contact form. In your request, provide as much detail as possible about the conditions under which your samples should be analyzed, the number of measurements planned, and any necessary sample preparation.
- Download and complete the two forms provided below (Sample Accompanying Sheet and Measurement Order).
- Include your Measurement Order and one Sample Accompanying Sheet for each sample in your sample shipment. This will help us identify your samples accurately. Send your samples to the following address: Linseis Shanghai Scientific, Service Lab, Kaige Scientific Park 2653 Hunan Road, 201315 Shanghai, Email: info[at]linseis.com, Subject: Contract Measurement
- Usually the measurement can be performed within 10-14 days and the result can be sent via email. The procedure depends on the measurement conditions and the number of samples.
OVERVIEW
